MICROELECTRONICS JOURNAL（微电子杂志）影响因子_期刊投稿发表

期刊简介

Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.

微电子杂志自1969年出版以来，是一个传播微电子系统、电路和新兴技术的研究和应用的国际论坛。《微电子学杂志》上发表的论文经过同行评审，以确保原创性、相关性和及时性。微电子学杂志邀请下列所有领域的重要研究和应用论文发表。此外，亦会考虑有关近期发展的全面检讨/调查文件。微电子学杂志涵盖电路和系统。本主题包括但不限于：模拟、数字、混合和射频电路及相关设计方法逻辑、结构和系统级综合测试、可测试性设计、机内自测试面积、功率和热分析与设计混合域模拟和设计嵌入式系统非冯·诺依曼计算及有关技术和电路高复杂性系统综合的设计和试验SoC、NoC、SIP和NIP设计与测试;三维一体化设计与分析新兴的器件技术和电路，如FinFET、SET、自旋电子学、SFQ、MTJ等。应用方面，如信号和图像处理，包括用于密码学的电路，传感器，和致动器，包括传感器网络，可靠性和质量问题，以及经济模型也受欢迎。

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