MICROELECTRONICS RELIABILITY Q4区

期刊简介

Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.

微电子可靠性，致力于传播微电子器件、电路和系统可靠性的最新研究成果和相关信息，从材料、工艺和制造到设计、测试和操作。该杂志的内容包括以下主题：测量、理解和分析;评价和预测;建模和模拟;方法和缓解。将可靠性与微电子工程的其他重要领域（如设计、制造、集成、测试和现场操作）相结合的论文也将受到欢迎，特别鼓励报告该领域和特定应用领域案例研究的实用论文。大多数被接受的论文将作为研究论文发表，描述重大进展和已完成的工作。评论重要的发展中的共同关心的主题的论文可以作为评论论文发表。较初步性质的紧急通信和关于当前感兴趣的已完成实际工作的简短报告可考虑作为研究说明出版。所有稿件均需经过该领域顶尖专家的同行评审。

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