MICRON Q2区

期刊简介

Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.

Micron是一个跨学科的论坛，面向所有涉及显微镜新应用或高级显微镜发挥核心作用的工作。该杂志将发表显微镜和微分析的设计、方法、应用、实践或理论，包括光学、电子束、X射线显微断层摄影和扫描探针系统的报告。它还致力于定期发表评论论文、简短通讯以及显微镜和微分析当代发展的专题。该杂志涵盖了显微镜对生物学、生命科学、纳米科学和纳米技术、材料科学和工程等领域的知识做出重大贡献的原创性研究。

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