JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS（电子测试理论与应用杂志）影响因子_期刊投稿发表

期刊简介

The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics:Testing of VLSI devices printed circuit boards, and electronic systems;Testing of analog and digital electronic circuits;Testing of microprocessors, memories, and signal processing devices;Fault modeling;Test generation;Fault simulation;Testability analysis;Design for testability;Synthesis for testability;Built-in self-test;Test specification;Fault tolerance;Formal verification of hardware;Simulation for verification;Design debugging;AI methods and expert systems for test and diagnosis;Automatic test equipment (ATE);Test fixtures;Electron Beam Test Systems;Test programming;Test data analysis;Economics of testing;Quality and reliability;CAD Tools;Testing of wafer-scale integration devices;Testing of reliable systems;Manufacturing yield and design for yield improvement;Failure mode analysis and process improvement

电子测试杂志：理论和应用是一个国际论坛，传播研究和应用信息，在电子测试领域。这是唯一一本专门讨论电子测试的杂志。发表在《电子测试杂志：《理论与应用》是通过同行评审选出的，以确保原创性、及时性和相关性。该杂志提供档案材料，并通过其快速的出版周期，努力把最新的成果，研究人员和从业人员。虽然它强调发表珍贵的未发表材料，但需要更广泛曝光的具有特殊价值的会议论文，在编辑的斟酌下，也会发表，只要它们符合期刊的同行评审标准。电子测试杂志：《理论与应用》还寻求清晰的书面调查和评论文章，以促进对技术发展水平的更好理解。《电子测试杂志：理论与应用包括但不限于以下主题：超大规模集成电路器件、印刷电路板和电子系统的测试;模拟和数字电子电路的试验微处理机、存储器和信号处理装置的试验断层建模;测试生成;故障模拟;测试性分析;可测试性设计可测试性的综合内置自检;试验规范;容错性;硬件的形式验证;模拟验证;设计调试;测试和诊断用的人工智能方法和专家系统自动测试设备（ATE）;试验夹具;电子束试验系统测试程序;试验数据分析;试验的经济性质量和可靠性;圆片级集成器件的测试;可靠系统的试验制造成品率和提高成品率的设计失效模式分析和过程改进

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