IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY Q3区

期刊简介

The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.

本出版物的范围包括但不限于以下内容的可靠性：器件、材料、工艺、接口、集成微系统（包括MEMS和传感器）、晶体管、技术（CMOS、BiCMOS等）集成电路（IC、SSI、MSI、LSI、ULSI、ELSI等），薄膜晶体管应用。从概念阶段到研发阶段再到生产规模扩大，每个阶段对此类实体可靠性的测量和理解，为产品成功上市提供了关于器械、材料、工艺、包装和其他必需品可靠性的整体数据库。该可靠性数据库是确保产品质量、满足客户期望的基础。这样开发的产品具有高可靠性。由于产品缺陷已被发现（根本原因分析）并设计出最终产品，因此将实现高质量。这种不断提高可靠性和质量的过程将产生一个上级的产品。最后，可靠性和质量不是一回事;而且在某种意义上，可以或必须做的每件事都能保证产品在客户条件下在现场成功地运行。我们的目标是抓住这些进步。另一个目标是将交叉交流的重点放在电子材料和器件可靠性的最新技术水平上，并提供对影响可靠性的基本现象的基本理解。此外，该出版物是可靠性跨学科研究的论坛。总体目标是提供前沿/最先进的信息，这与可靠产品的创建密切相关。

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